Scanning electron microscopy (SEM), also known as SEM analysis or SEM microscopy, is performed with a Scanning Electronic Microscope. MDT has an Aspex Model 3025 SEM system with Automated Feature Analysis (AFA) software and Energy Dispersive X-ray Spectroscopy (EDS) capabilities. Scanning electron microscopy is performed at high magnifications, generates high-resolution images and precisely measures very small features and objects.
Automated Feature Analysis software provides fully automated, unattended search and analysis of particles on six 25mm discs. The Energy Dispersive X-ray Spectroscopy is able to carry out qualitative analysis from an image on the SEM, acquire and print color digital images, generate reports and export reports.
MDT's Aspex 3025 features both a high vacuum secondary electron detector and a high vacuum backscatter electron imaging detector. The system is capable of performing automated residue analysis by scanning electron microscopy/energy dispersive spectroscopy.
The backscatter electron detector is capable of detecting particles down to 0.5 microns. Acceleration voltage is variable from 0.5 KV to 25KV. The X-ray detector features SDD technology and has a 20x20mm window. The SEM chamber, stage and all other accessories are completely integrated with EDS for proper alignment and take-off angle.
The system is controlled from a personal computer operating in Windows, includes dual flat panel color monitors (1 for imaging and 1 for analysis of data), and features a joystick stage control panel. The stage has an X travel range of 100mm, a Y travel range of 80mm and a Z travel range of 25mm. Samples are easily removed from the chamber to facilitate ease of exchanging samples.
Please take a few moments to tell us more about your device and test requirements in our short questionnaire, and we will be happy to provide you with a quotation for using this system.